X-ray diffraction is analytical method based on inspection of crystalline structure of samples used in applications, such as metallurgy, mineralogy, powders, pigments, polymers, surface layers and strain mapping. The traditional X-ray diffraction uses monochromatic X-rays which make the apparatus large and slow. ADVACAM’s spectral detectors based on Timepix3 chip with high resolution makes the diffraction system fast and compact. The sample analysis can be performed 100 times faster compared to the conventional systems. Due to fast speed of the analysis large areas of the sample can be analysed by scanning.
The polychromatic X-ray beam (instead of monochromatic) can be used with ADVACAM’s energy dispersive detectors. Polychromatic X-ray diffraction system is compact and less complex than the one with monochromatic X-ray that require mechanically moving parts. The high resolution spectral detector can be placed close to the sample covering large solid angle.